Publication details

Conference Paper (international conference)

Improving statistical measures of feature subsets by conventional and evolutionary approaches

Mayer H., Somol Petr, Huber R., Pudil Pavel

: Advances in Pattern Recognition. Proceedings, p. 77-86 , Eds: Ferri J. F., Inesta M. J., Amin A., Pudil P.

: Springer, (Berlin 2000)


: Joint IAPR International Workshops SSPR 2000 and SPR 2000, (Alicante, ES, 30.08.2000-01.09.2000)

: AV0Z1075907

: AKTION 23p20, MŠMT, KONTAKT ME 187/98, MŠMT, VS96063, MŠMT

(eng): Comparative analysis of recently developed and highly effective sequential feature selection algorithms with approaches based on evolutionary algorithms, enabling parallel feature subset selection, is presented.

: 12B, 09K

: JC