Department of Pattern Recognition

(eng): Although computer graphics uses measured view and illumination dependent data to achieve realistic digital reproduction of real-world material properties, the extent of their utilization is currently limited by a complicated acquisition process. Due to the high dimensionality of such data, the acquisition process is demanding on time and resources. Proposed is a method of approximate reconstruction of the data from a very sparse dataset, obtained quickly using inexpensive hardware. This method does not impose any restrictions on input datasets and can handle anisotropic, non-reciprocal view and illumination direction-dependent data. The method's performance was tested on a number of isotropic and anisotropic apparent BRDFs, and the results were encouraging.