Grim Jiří, Somol Petr, Pudil Pavel
:
Digital Image Forgery Detection by Local Statistical Models
, 2010 Sixth International Conference on Intelligent Information Hiding and Multimedia Signal Processing, p. 579-582
, Eds: Echizen Isao, Pan Jeng-Shyang, Fellner Dieter, Nouak Alexander, Kuijper Arjan, Jain Lakhmi C., 6th International Conference on Intelligent Information Hiding and Multimedia Signal Processing (IIH-MSP 2010),
(Darmstadt, DE, 15.10.2010-17.10.2010) [2010]
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DOI: 10.1109/IIHMSP.2010.147
Pudil Pavel, Somol Petr, Haindl Michal
:
Introduction to Statistical Pattern Recognition
, MATEO - The European Network of Mechatronics Centres and Industrial Controllers 2006, p. 163-170
, Eds: Troblova , MATEO - The European Network of Mechatronics Centres and Industrial Controllers 2006,
(Železná Ruda, CZ, 14.12.2006-16.12.2006) [2006]
Pudil Pavel, Somol Petr
:
Current feature selection techniques in pattern recognition
, Proceedings of the 4th International Conference on Computer Recognition Systems, p. 53-68
, Eds: Kurzynski M., Puchala E., Wozniak M., Springer,
(Heidelberg 2005)
Advances in Soft Computing. , CORES'05 /4./,
(Rydzyna, PL, 22.05.2005-25.05.2005) [2005]
Grim Jiří, Pudil Pavel, Somol Petr
:
Boosting in probabilistic neural networks
, Proceedings of the 16th International Conference on Pattern Recognition, p. 136-139
, Eds: Kasturi R., Laurendeau D., Suen C., IEEE Computer Society,
(Los Alamitos 2002)
, International Conference on Pattern Recognition /16./,
(Québec City, CA, 11.08.2002-15.08.2002) [2002]
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Somol Petr, Pudil Pavel, Ferri F. J., Kittler J.
:
Fast Branch & Bound algorithm in feature selection
, Proceedings of SCI 2000. The 4th World Multiconference on Systemics, Cybernetics and Informatics, p. 646-651
, Eds: Sanchez B., Pineda M. J., Wolfmann J., IIIS,
(Orlando 2000)
, World Multiconference on Systemics, Cybernetics and Informatics /4./,
(Orlando, US, 23.07.2000-26.07.2000) [2000]
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Somol Petr, Pudil Pavel
:
Oscillating search algorithms for feature selection
, Proceedings of the 15th International Conference on Pattern Recognition, p. 406-409
, Eds: Sanfeliu A., Villanueva J. J., Vanrell M., IEEE Computer Society,
(Los Alamitos 2000)
, International Conference on Pattern Recognition /15./,
(Barcelona, ES, 03.09.2000-07.09.2000) [2000]
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